IR-2200 Microscope System enables the user to inspect sub-surface images including MEMS device, 3D stacks, incoming wafers, photovoltaic and wafer level CSP’s with an astonishing level of precision; while offering many capabilities and flexibility not available with traditional microscopes.
The IR-2200 system integrates the infrared table top microscope system with software and 4.1 Megapixel USB-3.0 NIR Camera.
This system provides all necessary features for high precision measurements, image capture, verification and inspection of materials transparent to the near infrared (NIR) / Shortwave Infrared (SWIR) wavelengths.
Capture from a wide variety of cameras and frame grabbers.
Control camera parameters like exposure, gain, and gamma from within the application.
Display user congurable color mapping of up to 16-bit monochrome data.
Capture single frames to BMP, JPEG, RAW, or TIFF.
Capture image sequences to AVI or RAW.
Extensive array of lter options (average, low/high pass, median, laplace, etc.)
Built in non-uniformity correction
» Full image and ROI histograms and plotting capabilities.
» Optional feature segmentation using thresholding capabilities to extract blobs and other feature types.
» Data export to Microsoft Excel.
» Extensible with support for custom image acquisition drivers, image processing functions, image feature identication ,and custom charts written in C/C++, C#, or VB.NET.